• DocumentCode
    2013495
  • Title

    Orderly Random Testing for Both Hardware and Software

  • Author

    Xu, Shiyi

  • Author_Institution
    Shanghai Univ., Shanghai, China
  • fYear
    2008
  • fDate
    15-17 Dec. 2008
  • Firstpage
    160
  • Lastpage
    167
  • Abstract
    Based on random testing, this paper introduces a new concept of orderly random testing for both hardware and software systems. Random testing, having been employed for years, seems to be inefficient for its random selection of test patterns. Therefore, a new concept of pre-determined distance among test vectors is proposed in the paper to make it more effective in testing. The idea is based on the fact that the larger the distance between two adjacent test vectors in a test sequence, the more the faults will be detected by the test vectors. Procedure of constructing such a testing sequence is presented in detail. The new approach has shown its remarkable advantage of fitting in with both hardware and software testing. Experimental results and mathematical analysis are also given to evaluate the performances of the novel method.
  • Keywords
    computer testing; program testing; fault testing; hardware testing; orderly random testing; software testing; Circuit faults; Circuit testing; Fault detection; Hamming distance; Hardware; Random number generation; Software systems; Software testing; System testing; Test pattern generators; Black-box Testing; Cartesian Distance; Generation Matrix; Hamming Distance; Pre-determined Distance; Random Testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Dependable Computing, 2008. PRDC '08. 14th IEEE Pacific Rim International Symposium on
  • Conference_Location
    Taipei
  • Print_ISBN
    978-0-7695-3448-0
  • Electronic_ISBN
    978-0-7695-3448-0
  • Type

    conf

  • DOI
    10.1109/PRDC.2008.7
  • Filename
    4725292