• DocumentCode
    2013555
  • Title

    Electronic Transport Properties of Fe-doped CoSb3 Prepared by Encapsulated Induction Melting

  • Author

    Park, Kwan-Ho ; You, Sin-Wook ; Ur, Soon-Chul ; Kim, Il-Ho

  • Author_Institution
    Dept. of Mater. Sci. & Eng., Chungju Nat. Univ., Chungbuk
  • fYear
    2006
  • fDate
    6-10 Aug. 2006
  • Firstpage
    435
  • Lastpage
    438
  • Abstract
    Fe-doped CoSb3 skutterudites were prepared by encapsulated induction melting and their thermoelectric and electronic transport properties were investigated. The positive signs of Seebeck and Hall coefficients for all Fe-doped specimens revealed that Fe atoms successfully acted as p-type dopants by substituting Co atoms. Carrier concentration increased with increasing the Fe doping content and the Fe dopants could affect the electronic structure of CoSb3 and generate excess holes. However, carrier mobility decreased with increasing the doping content, which indicates that the hole mean free path was reduced by the impurity scattering. Seebeck coefficient and electrical resistivity were almost independent of carrier concentration between 5.1times1018 and 1.2times1020/cm3 because the increase in carrier concentration by doping was competitive with the decrease in carrier mobility by the impurity scattering. Seebeck coefficient showed a positive value at all temperatures examined and it increased as the temperature increased. Temperature dependence of electrical resistivity suggested that Co1-xFexSb3 is a highly degenerate semiconducting material. Thermal conductivity was considerably reduced by Fe doping and the lattice contribution was dominant in the Fe-doped CoSb3 skutterudites
  • Keywords
    Hall effect; Seebeck effect; carrier density; carrier mobility; cobalt compounds; degenerate semiconductors; electrical resistivity; impurity scattering; iron; melting; semiconductor doping; thermal conductivity; CoSb3:Fe; Hall coefficients; Seebeck coefficients; carrier concentration; carrier mobility; electrical resistivity; encapsulated induction melting; holes; impurity scattering; semiconductor doping; skutterudites; thermal conductivity; thermoelectricity; Conducting materials; Doping; Electric resistance; Iron; Scattering; Semiconductivity; Semiconductor impurities; Temperature dependence; Thermal conductivity; Thermoelectricity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 2006. ICT '06. 25th International Conference on
  • Conference_Location
    Vienna
  • ISSN
    1094-2734
  • Print_ISBN
    1-4244-0811-3
  • Electronic_ISBN
    1094-2734
  • Type

    conf

  • DOI
    10.1109/ICT.2006.331308
  • Filename
    4133323