DocumentCode :
2013565
Title :
Electro-optical characteristics in accordance with dielectric thickness of AC-PDP
Author :
Kim, S.B. ; Koo, J.G. ; Lee, Hwang Soo ; Kim, B.C. ; Park, S.W. ; Jung, K.B. ; Choi, Jun H. ; Jung, Yongmin ; Choi, Eun Ha
Author_Institution :
UPD Corp., Gyeonggi, South Korea
fYear :
2003
fDate :
5-5 June 2003
Firstpage :
220
Abstract :
Summary form only given, as follows. The improvement of luminance and luminous efficiency is the one of the most important part in AC-PDP. To achieve high luminance and luminous efficiency, we make an experiment on electro-optical characteristics in accordance with the dielectric thickness of AC-PDP. The wall voltages play an important role in lowering the sustaining voltage through wall charges accumulated on the dielectric surface in AC-PDP. The wall charges and voltages, as well as capacitances, are experimentally measured in terms of the dielectric thickness, whose thickness is ranged from 20 /spl mu/m to 50 /spl mu/m. We have developed a simple method to measure the wall charges and voltages resulting from the measurements of all capacitances in AC-PDP. These values are based on charge-voltage (Q-V) characteristic curves before and after the discharge, along with the voltage margin relation to the wall voltage and dielectric-gap voltage induced by wall charge. To find out optimal condition of dielectric thickness in AC-PDP, we make an experiment in the variety of dielectric layer thickness.
Keywords :
brightness; capacitance; electro-optical effects; plasma displays; 20 to 50 micron; AC-PDP; capacitances; charge-voltage characteristic curves; dielectric thickness; dielectric-gap voltage; electro-optical characteristics; luminance; luminous efficiency; optimal condition; voltage margin relation; wall charges; wall voltages; Brightness; Capacitance measurement; Current measurement; Dielectric measurements; Discharges; Electrodes; Flat panel displays; Large screen displays; Plasma displays; Voltage;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2003. ICOPS 2003. IEEE Conference Record - Abstracts. The 30th International Conference on
Conference_Location :
Jeju, South Korea
ISSN :
0730-9244
Print_ISBN :
0-7803-7911-X
Type :
conf
DOI :
10.1109/PLASMA.2003.1228716
Filename :
1228716
Link To Document :
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