DocumentCode :
2013836
Title :
Test data compression for system-on-a-chip using Golomb codes
Author :
Chandra, Anshuman ; Chakrabarty, Krishnendu
Author_Institution :
Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
fYear :
2000
fDate :
2000
Firstpage :
113
Lastpage :
120
Abstract :
We present a new test data compression method and decompression architecture based on Golomb codes. The proposed method is especially suitable for encoding precomputed test sets for embedded cores in a system-on-a-chip (SOC). The major advantages of Golomb codes include very high compression, analytically predictable compression results, and a low-cost and scalable on-chip decoder. In addition, the novel interleaving decompression architecture allows multiple cores in an SOC to be tested concurrently using a single ATE I/O channel. We demonstrate the effectiveness of the proposed approach by applying it to the ISCAS benchmark circuits and to two industrial production circuits. We also use analytical and experimental means to highlight the superiority of Golomb codes over run-length codes
Keywords :
application specific integrated circuits; automatic testing; data compression; industrial property; integrated circuit testing; runlength codes; ATE I/O channel; Golomb codes; ISCAS benchmark circuits; decompression architecture; embedded cores; industrial production circuits; interleaving decompression architecture; multiple cores; precomputed test sets; run-length codes; system-on-a-chip; test data compression; Built-in self-test; Channel capacity; Circuit testing; Contracts; Costs; Decoding; Production; System testing; System-on-a-chip; Test data compression;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location :
Montreal, Que.
ISSN :
1093-0167
Print_ISBN :
0-7695-0613-5
Type :
conf
DOI :
10.1109/VTEST.2000.843834
Filename :
843834
Link To Document :
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