• DocumentCode
    2013836
  • Title

    Test data compression for system-on-a-chip using Golomb codes

  • Author

    Chandra, Anshuman ; Chakrabarty, Krishnendu

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Duke Univ., Durham, NC, USA
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    113
  • Lastpage
    120
  • Abstract
    We present a new test data compression method and decompression architecture based on Golomb codes. The proposed method is especially suitable for encoding precomputed test sets for embedded cores in a system-on-a-chip (SOC). The major advantages of Golomb codes include very high compression, analytically predictable compression results, and a low-cost and scalable on-chip decoder. In addition, the novel interleaving decompression architecture allows multiple cores in an SOC to be tested concurrently using a single ATE I/O channel. We demonstrate the effectiveness of the proposed approach by applying it to the ISCAS benchmark circuits and to two industrial production circuits. We also use analytical and experimental means to highlight the superiority of Golomb codes over run-length codes
  • Keywords
    application specific integrated circuits; automatic testing; data compression; industrial property; integrated circuit testing; runlength codes; ATE I/O channel; Golomb codes; ISCAS benchmark circuits; decompression architecture; embedded cores; industrial production circuits; interleaving decompression architecture; multiple cores; precomputed test sets; run-length codes; system-on-a-chip; test data compression; Built-in self-test; Channel capacity; Circuit testing; Contracts; Costs; Decoding; Production; System testing; System-on-a-chip; Test data compression;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2000. Proceedings. 18th IEEE
  • Conference_Location
    Montreal, Que.
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-0613-5
  • Type

    conf

  • DOI
    10.1109/VTEST.2000.843834
  • Filename
    843834