DocumentCode :
2013847
Title :
Impact of Inductance on the Performance of Single Walled Carbon Nanotube Bundle Interconnects
Author :
Sahoo, Manodipan ; Rahaman, Hafizur ; Bhattacharya, Baidurya
Author_Institution :
Dept. of Inf. Technol., Bengal Eng. & Sci. Univ., Shibpur, India
fYear :
2013
fDate :
10-12 Dec. 2013
Firstpage :
16
Lastpage :
20
Abstract :
In this work, we have studied the inductive properties of interconnects built with Single Walled Carbon Nan tube (SWCNT) bundle. We have used the most recent ITRS-2011 data while estimating the RLC parameters of SWCNT bundle interconnects. In our analysis, we have used the classical ABCD-parameter-matrix based method and a delay allowance of 50%. Simulations are performed for both sparse and dense SWCNT bundle interconnects at 21 nm and 15 nm technology nodes, considering three levels of their application: local, intermediate, and global. It is observed that for a 100 MHz periodic square wave input with a rise time of 10 ps, SWCNT bundle interconnects are not impacted by inductance. It is shown that for the given input signal and SWCNT bundle parameters, the length over which the inductive effects will be more prominent, has little practical significance. It is quantitatively shown that the inductive effects will mostly impact the long-intermediate and global interconnects. With technology scaling, such effects may worsen the performance. It is also observed that the Elmore-based methodology for delay estimation of SWCNT bundle interconnects predicts the actual delay very accurately with a maximum error of only 5.46%.
Keywords :
carbon nanotubes; delays; equivalent circuits; integrated circuit interconnections; ABCD-parameter-matrix based method; C; Elmore delay model; RLC parameters; SWCNT bundle interconnects; SWCNT bundle parameters; delay estimation; frequency 100 MHz; global interconnects; inductive effects; single walled carbon nanotube bundle interconnects; size 15 nm; size 21 nm; technology scaling; Carbon nanotubes; Delays; Inductance; Integrated circuit interconnections; Quantum capacitance; Resistance; ABCD-parameter; Elmore delay model; Interconnect delay; Single Walled Carbon Nanotube (SWCNT); Technology scaling;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic System Design (ISED), 2013 International Symposium on
Conference_Location :
Singapore
Print_ISBN :
978-0-7695-5143-2
Type :
conf
DOI :
10.1109/ISED.2013.10
Filename :
6808633
Link To Document :
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