Title :
A comprehensive TDM comparator scheme for effective analysis of oscillation-based test
Author :
Roh, Jeongjin ; Abraham, Jacob A.
Author_Institution :
Comput. Eng. Res. Center, Texas Univ., Austin, TX, USA
Abstract :
We propose a comprehensive built-in self-test (BIST) methodology for analog and mixed-signal circuits. A time-division multiplexing (TDM) comparator scheme was proposed as an effective signature analyzer for on-chip analog response compaction and pass/fail decision with minimum hardware overhead. By applying this scheme to the oscillation-based test, the oscillation frequency can be measured indirectly as well as the oscillation amplitude to increase the fault coverage. The experimental results demonstrate that the proposed scheme can significantly reduce test time of the oscillation-based test with higher fault coverage
Keywords :
analogue integrated circuits; built-in self test; comparators (circuits); fault diagnosis; logic testing; mixed analogue-digital integrated circuits; time division multiplexing; BIST; TDM comparator scheme; analog circuits; built-in self-test; fault coverage; minimum hardware overhead; mixed-signal circuits; on-chip analog response compaction; oscillation amplitude; oscillation frequency; oscillation-based test; pass/fail decision; signature analyzer; test time; Analog circuits; Built-in self-test; Circuit faults; Circuit noise; Circuit testing; Hardware; Hip; Jacobian matrices; Life testing; Time division multiplexing;
Conference_Titel :
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7695-0613-5
DOI :
10.1109/VTEST.2000.843838
