Title :
A Functional Unit with Small Variety of Highly Reliable Cells
Author :
Suzuki, Kazunori ; Nakada, Takashi ; Nakanishi, Masaki ; Yamashita, Shigeru ; Nakashima, Yasuhiko
Author_Institution :
Grad. Sch. of Inf., Nara Inst. of Sci. & Technol., Ikoma, Japan
Abstract :
Recently, the miniaturization process has brought an increase in transistor variations and in the failure rate at transistors. We propose a small variety of new standard cells. The proposed cells can correct and detect transistor faults. A functional unit with the proposed cells shows better fault tolerance. The area of this unit is approximately 1.4 times that of traditional cells.
Keywords :
fault diagnosis; semiconductor device reliability; transistors; miniaturization process; transistor failure rate; transistor faults; transistor variations; Circuit faults; Copper; Delay effects; Electrical fault detection; Fault detection; Fault tolerance; Informatics; Logic; MOS devices; Threshold voltage; fault detection; fault tolerance; transistor variation;
Conference_Titel :
Dependable Computing, 2008. PRDC '08. 14th IEEE Pacific Rim International Symposium on
Conference_Location :
Taipei
Print_ISBN :
978-0-7695-3448-0
Electronic_ISBN :
978-0-7695-3448-0
DOI :
10.1109/PRDC.2008.39
