DocumentCode :
2014241
Title :
Hardware resource minimization for histogram-based ADC BIST
Author :
Renovell, M. ; Azaïs, F. ; Bernard, S. ; Bertrand, Y.
Author_Institution :
Lab. d´´Inf. Robotique Microelectron., Univ. des Sci. et Tech. du Languedoc, Montpellier, France
fYear :
2000
fDate :
2000
Firstpage :
247
Lastpage :
252
Abstract :
The paper proposes a BIST approach for deriving the main characterization parameters of ADCs from histogram data. An adequate choice of input stimuli and time decomposition scheme is proposed in order to minimize the extra on-chip hardware required to extract these parameters. The idea of time decomposition consists in replacing classical hardware-consuming concurrent calculations by hardware-saving time-spread calculations. The decomposition technique is used both at high level (specific test phases are dedicated to each ADC parameter computation) and low level (sequential steps inside each test phase). Pseudo-algorithms are given to derive offset, gain error and nonlinearities
Keywords :
analogue-digital conversion; automatic testing; built-in self test; integrated circuit testing; network parameters; characterization parameters; gain error; hardware resource minimization; hardware-saving time-spread calculations; histogram-based ADC BIST; input stimuli; nonlinearities; offset; on-chip hardware; parameter computation; sequential steps; test phases; time decomposition scheme; Built-in self-test; Circuit testing; Data mining; Hardware; Hip; Histograms; Postal services; Robots; Tellurium; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location :
Montreal, Que.
ISSN :
1093-0167
Print_ISBN :
0-7695-0613-5
Type :
conf
DOI :
10.1109/VTEST.2000.843852
Filename :
843852
Link To Document :
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