Title :
Functional memory faults: a formal notation and a taxonomy
Author :
Van de Goor, Ad J. ; AL-Ars, Zaid
Author_Institution :
Fac. of Inf. Technol. & Syst., Delft Univ. of Technol., Netherlands
Abstract :
This paper presents a notation for describing functional fault models, which may occur in memory devices. Using this notation, the space of all possible memory faults has been constructed. It has been shown that this space is infinite, and contains the currently established fault models. New fault models in this space have been identified and verified using resistive and capacitive defect injection and simulation of a DRAM model
Keywords :
DRAM chips; fault diagnosis; fault simulation; integrated circuit testing; DRAM model; capacitive defect injection; fault models; formal notation; functional memory faults; memory devices; memory faults; resistive defect injection; taxonomy; Automatic testing; Decoding; Electrical fault detection; Fault detection; Logic testing; Random access memory; Read only memory; Space exploration; System testing; Taxonomy;
Conference_Titel :
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7695-0613-5
DOI :
10.1109/VTEST.2000.843856
