Title :
Fault detection methodology and BIST method for 2nd order Butterworth, Chebyshev and Bessel filter approximations
Author :
Calvano, José Vicente ; Alves, Vladimir Castro ; Lubaszewski, Marcelo
Author_Institution :
Brazilian Navy Res. Inst., Brazil
Abstract :
This work proposes a new BIST scheme for 2nd order Butterworth, Chebyshev and Bessel filter approximations, using the transient analysis of simple input test vectors. A functional approach for fault modeling in 2nd order filters is presented and the transient response method is used for fault detection. The approach considers the filter as a 2nd order dynamic system where ωc and Qp deviations are faults to be detected. The peak time is the observed parameter that is evaluated in order to verify the filter correctness. The obtained results are very promising since all of ωc and Qp deviations as well as 100% of passive components are detected for this BIST scheme
Keywords :
Bessel functions; Butterworth filters; Chebyshev filters; analogue circuits; built-in self test; circuit testing; fault diagnosis; fault simulation; transient analysis; BIST method; Bessel filter approximations; Chebyshev filter approximations; fault detection methodology; fault modeling; filter correctness; functional approach; input test vectors; passive components; second-order Butterworth filters; transient analysis; transient response method; Band pass filters; Built-in self-test; Chebyshev approximation; Circuit faults; Electrical fault detection; Fault detection; Frequency; Low pass filters; Neodymium; Transfer functions;
Conference_Titel :
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7695-0613-5
DOI :
10.1109/VTEST.2000.843861