• DocumentCode
    2014571
  • Title

    MBE growth of GaPxAs1−x and GaSbxAs1−x solid solutions with As2 or As4 molecular beam

  • Author

    Emelyanov, Eugene A. ; Putyato, Mikhail A. ; Semyagin, Boris R. ; Vasilenko, A. ; Preobrazhenskii, Valery V.

  • Author_Institution
    Inst. of Semicond. Phys., SB RAS, Novosibirsk, Russia
  • fYear
    2010
  • fDate
    June 30 2010-July 4 2010
  • Firstpage
    109
  • Lastpage
    110
  • Abstract
    The composition of multicomponent AIIIBV solid solutions allows designing semiconductor heterostructures with desired properties to solve the so-called problem of “band engineering”. Growth of solid solution with given composition is a serious problem. Prediction of solid solution composition based on the growth model could facilitate solution of this task. Information about interaction of group V molecules with the growth surface is required to create such a model. Therefore, determination of adsorption, desorption, diffusion, and incorporation kinetic constants for these molecules is an important task. This can be achieved through a comparative analysis of incorporation effectiveness of antimony, phosphorus, and arsenic from different molecular forms.
  • Keywords
    III-V semiconductors; adsorption; antimony compounds; desorption; diffusion; gallium compounds; molecular beam epitaxial growth; phosphorus compounds; semiconductor epitaxial layers; semiconductor growth; semiconductor heterojunctions; solid solutions; GaPxAs1-x; GaSbxAs1-x; MBE; adsorption; desorption; diffusion; molecular-beam epitaxy; semiconductor heterostructures; solid solutions; Molecular beam epitaxial growth; Seminars; “band engineering”; Molecular-beam epitaxy (MBE); arsenic molecular form; multicomponent AIIIBV solid solutions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Micro/Nanotechnologies and Electron Devices (EDM), 2010 International Conference and Seminar on
  • Conference_Location
    Novosibirsk
  • Print_ISBN
    978-1-4244-6626-9
  • Type

    conf

  • DOI
    10.1109/EDM.2010.5568645
  • Filename
    5568645