DocumentCode
2014627
Title
Linear independence as evaluation criterion for two-dimensional test pattern generators
Author
Mrugalski, Grzegorz ; Tyszer, Jerzy ; Rajski, Janusz
Author_Institution
Poznan Tech. Univ., Poland
fYear
2000
fDate
2000
Firstpage
377
Lastpage
386
Abstract
The probability of obtaining desired test patterns in subsequences generated by two-dimensional test pattern generators is examined. Various architectures of generators comprising of linear feedback shift registers, cellular automata and associated phase shifters are thoroughly investigated. Two new algorithms that can be employed to synthesize phase shifters minimizing linear dependencies and assuring highly balanced usage of all generator stages are also introduced
Keywords
binary sequences; built-in self test; cellular automata; logic testing; probability; shift registers; cellular automata; generator stages; linear dependencies; linear feedback shift registers; linear independence; phase shifters; probability; subsequences; two-dimensional test pattern generators; Automata; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Graphics; Hardware; Phase shifters; Shift registers; Test pattern generators;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location
Montreal, Que.
ISSN
1093-0167
Print_ISBN
0-7695-0613-5
Type
conf
DOI
10.1109/VTEST.2000.843868
Filename
843868
Link To Document