Title :
Linear independence as evaluation criterion for two-dimensional test pattern generators
Author :
Mrugalski, Grzegorz ; Tyszer, Jerzy ; Rajski, Janusz
Author_Institution :
Poznan Tech. Univ., Poland
Abstract :
The probability of obtaining desired test patterns in subsequences generated by two-dimensional test pattern generators is examined. Various architectures of generators comprising of linear feedback shift registers, cellular automata and associated phase shifters are thoroughly investigated. Two new algorithms that can be employed to synthesize phase shifters minimizing linear dependencies and assuring highly balanced usage of all generator stages are also introduced
Keywords :
binary sequences; built-in self test; cellular automata; logic testing; probability; shift registers; cellular automata; generator stages; linear dependencies; linear feedback shift registers; linear independence; phase shifters; probability; subsequences; two-dimensional test pattern generators; Automata; Automatic testing; Built-in self-test; Circuit faults; Circuit testing; Graphics; Hardware; Phase shifters; Shift registers; Test pattern generators;
Conference_Titel :
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7695-0613-5
DOI :
10.1109/VTEST.2000.843868
