DocumentCode
2014645
Title
P1450.1: STIL for the simulation environment
Author
Wohl, Peter ; Biggs, Nathan
Author_Institution
Synopsys Inc., Williston, VT, USA
fYear
2000
fDate
2000
Firstpage
389
Lastpage
394
Abstract
The Standard Test Interface Language (STIL IEEE-1450) was developed to transport patterns from the generation environment to testers. STIL was also shown to support test-generation input constructs. This paper analyzes the requirements of the simulation environment and presents extensions to STIL (IEEE-P1450.1) to support all aspects of test-pattern generation and simulation
Keywords
IEEE standards; automatic test pattern generation; circuit simulation; fault simulation; logic testing; timing; IEEE-1450; P1450.1; STIL; Standard Test Interface Language; generation environment; simulation environment; test patterns; test-generation input constructs; Condition monitoring; Databases; Design engineering; Discrete event simulation; Life testing; Pins; Signal mapping; Signal resolution; Time factors; Timing;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location
Montreal, Que.
ISSN
1093-0167
Print_ISBN
0-7695-0613-5
Type
conf
DOI
10.1109/VTEST.2000.843869
Filename
843869
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