Title :
P1450.1: STIL for the simulation environment
Author :
Wohl, Peter ; Biggs, Nathan
Author_Institution :
Synopsys Inc., Williston, VT, USA
Abstract :
The Standard Test Interface Language (STIL IEEE-1450) was developed to transport patterns from the generation environment to testers. STIL was also shown to support test-generation input constructs. This paper analyzes the requirements of the simulation environment and presents extensions to STIL (IEEE-P1450.1) to support all aspects of test-pattern generation and simulation
Keywords :
IEEE standards; automatic test pattern generation; circuit simulation; fault simulation; logic testing; timing; IEEE-1450; P1450.1; STIL; Standard Test Interface Language; generation environment; simulation environment; test patterns; test-generation input constructs; Condition monitoring; Databases; Design engineering; Discrete event simulation; Life testing; Pins; Signal mapping; Signal resolution; Time factors; Timing;
Conference_Titel :
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7695-0613-5
DOI :
10.1109/VTEST.2000.843869
