• DocumentCode
    2014664
  • Title

    Observations in ZnO thin films based pressure sensors

  • Author

    Al Ahmad, Mahmoud ; Al Taradeh, Nedal

  • Author_Institution
    Electr. Eng. Dept., UAE Univ., Al Ain, United Arab Emirates
  • fYear
    2015
  • fDate
    1-4 Feb. 2015
  • Firstpage
    1
  • Lastpage
    5
  • Abstract
    Recently real time monitoring systems of pressure variations has received noticeable interest. This work highlights some important issues and summaries several observations in published Zinc Oxide (ZnO) thin films based pressure sensor (TFPS) structures. New models for IV curve, pressure-output voltage variations have been developed based on empirical observations. In addition, the relations between the capacitance, sensitivity and resistance versus pressure variations have been modeled with noticeable agreements between evaluated and experimental results.
  • Keywords
    II-VI semiconductors; capacitance; pressure sensors; semiconductor thin films; thin film sensors; thin film transistors; zinc compounds; I-V curve; TFT pressure sensor; ZnO; capacitance; pressure-output voltage variations; resistance-pressure variations; sensitivity; zinc oxide thin films; Equations; Fitting; Logic gates; Mathematical model; Sensors; Thin film transistors; Zinc oxide; Characterizations; ZnO; design rules; materials parameters; piezoelectricity; thin films;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    GCC Conference and Exhibition (GCCCE), 2015 IEEE 8th
  • Conference_Location
    Muscat
  • Type

    conf

  • DOI
    10.1109/IEEEGCC.2015.7060040
  • Filename
    7060040