• DocumentCode
    2014677
  • Title

    Extraction of peak-to-peak and RMS sinusoidal jitter using an analytic signal method

  • Author

    Yamaguchi, Takahiro J. ; Soma, Mani ; Ishida, Masahiro ; Watanabe, Toshifumi ; Ohmi, Tadahiro

  • Author_Institution
    Advantest Labs. Ltd., Sendai, Japan
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    395
  • Lastpage
    402
  • Abstract
    This paper proposes a new method based on analytic signal theory for extracting both instantaneous and RMS sinusoidal jitter from PLL output signals. The method relies on the extension of a real signal into an analytic signal by utilizing the Hilbert transform. Both the theoretical basis and fundamental concepts of the proposed method are explained. A review of conventional testing methods is also presented. Results of Matlab simulations validate the performance of the proposed method for measuring random jitter. The method is further validated by comparing experimental sinusoidal jitter results with those measured with a time interval analyzer
  • Keywords
    Hilbert transforms; integrated circuit measurement; integrated circuit testing; jitter; phase locked loops; Hilbert transform; Matlab simulations; PLL output signals; RMS sinusoidal jitter; analytic signal; analytic signal method; peak-to-peak jitter; random jitter; testing methods; time interval analyzer; Circuits; Clocks; Frequency measurement; Laboratories; Phase locked loops; Radio access networks; Signal analysis; System testing; Timing jitter; Transfer functions;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    VLSI Test Symposium, 2000. Proceedings. 18th IEEE
  • Conference_Location
    Montreal, Que.
  • ISSN
    1093-0167
  • Print_ISBN
    0-7695-0613-5
  • Type

    conf

  • DOI
    10.1109/VTEST.2000.843870
  • Filename
    843870