DocumentCode
2014677
Title
Extraction of peak-to-peak and RMS sinusoidal jitter using an analytic signal method
Author
Yamaguchi, Takahiro J. ; Soma, Mani ; Ishida, Masahiro ; Watanabe, Toshifumi ; Ohmi, Tadahiro
Author_Institution
Advantest Labs. Ltd., Sendai, Japan
fYear
2000
fDate
2000
Firstpage
395
Lastpage
402
Abstract
This paper proposes a new method based on analytic signal theory for extracting both instantaneous and RMS sinusoidal jitter from PLL output signals. The method relies on the extension of a real signal into an analytic signal by utilizing the Hilbert transform. Both the theoretical basis and fundamental concepts of the proposed method are explained. A review of conventional testing methods is also presented. Results of Matlab simulations validate the performance of the proposed method for measuring random jitter. The method is further validated by comparing experimental sinusoidal jitter results with those measured with a time interval analyzer
Keywords
Hilbert transforms; integrated circuit measurement; integrated circuit testing; jitter; phase locked loops; Hilbert transform; Matlab simulations; PLL output signals; RMS sinusoidal jitter; analytic signal; analytic signal method; peak-to-peak jitter; random jitter; testing methods; time interval analyzer; Circuits; Clocks; Frequency measurement; Laboratories; Phase locked loops; Radio access networks; Signal analysis; System testing; Timing jitter; Transfer functions;
fLanguage
English
Publisher
ieee
Conference_Titel
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location
Montreal, Que.
ISSN
1093-0167
Print_ISBN
0-7695-0613-5
Type
conf
DOI
10.1109/VTEST.2000.843870
Filename
843870
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