Title :
Crosstalk effect removal for analog measurement in analog test bus
Author :
Su, Chauchin ; Chen, Yue-Tsang
Author_Institution :
Dept. of Electr. Eng., Nat. Central Univ., Chung-Li, Taiwan
Abstract :
A DSP based test methodology is proposed to remove the parasitic and crosstalk effects, the two major drawbacks when using the analog buses. Experiments, using SPICE simulation and real measurement data show a significant improvement over the direct measurement
Keywords :
automatic testing; crosstalk; design for testability; integrated circuit testing; mixed analogue-digital integrated circuits; DSP based test methodology; SPICE simulation; analog measurement; analog test bus; crosstalk effect removal; measurement data; mixed-signal circuits; parasitic effects; Circuit testing; Crosstalk; Digital signal processing; Integrated circuit interconnections; Integrated circuit measurements; Integrated circuit packaging; Integrated circuit testing; SPICE; Semiconductor device measurement; Wires;
Conference_Titel :
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7695-0613-5
DOI :
10.1109/VTEST.2000.843871
