High-level observability for effective high-level ATPG

Author

Corno, Fulvio ; Reorda, Matteo Sonza ; Squillero, Giovanni

Author_Institution

Dipt. di Autom. e Inf., Politecnico di Torino, Italy

fYear

2000

fDate

2000

Firstpage

411

Lastpage

416

Abstract

This paper focuses on observability, one of the open issues in high-level test generation. Three different approximate metrics for taking observability into account during RT-level ATPG are presented. Metrics range from a really naive and optimistic one to more sophisticated analysis. Metrics are evaluated including them in the calculation of the fitness function used in a RT-level ATPG. Advantages and disadvantages are illustrated. Experimental results show how sharp observability metrics are crucial for making effective RT-level ATPG possible: test sequences generated at RT-level outperform commercial gate-level ATPGs on some ITC99 benchmark circuits

Keywords

application specific integrated circuits; automatic test pattern generation; integrated circuit testing; logic testing; observability; ITC99 benchmark circuits; RT-level ATPG; approximate metrics; effective high-level ATPG; fitness function; high-level observability; sharp observability metrics; test sequences; Automatic test pattern generation; Automatic testing; Circuit faults; Circuit simulation; Circuit synthesis; Digital circuits; Hardware design languages; Logic testing; Observability; Test pattern generators;

fLanguage

English

Publisher

ieee

Conference_Titel

VLSI Test Symposium, 2000. Proceedings. 18th IEEE

Conference_Location

Montreal, Que.

ISSN

1093-0167

Print_ISBN

0-7695-0613-5

Type

conf

DOI

10.1109/VTEST.2000.843872

Filename

843872