Title :
Charge state of SOI nanowire sensors
Author :
Malyarenko, Nikolai F. ; Naumova, Olga V. ; Zhanaev, Erdem D. ; Popov, Vladimir P.
Author_Institution :
Novosibirsk State Tech. Univ., Novosibirsk, Russia
fDate :
June 30 2010-July 4 2010
Abstract :
The initial charge state of SOI nanowire sensors after their long storage in air ambient has been identified by measuring the drain-gate characteristics of SOI nanowire transistors. In the examined structures, the density of the surface charge was found to be ranging within the interval 2×1012-4×1012 cm-2. Two surface treatments were given to the samples to clean the surface of SOI nanowire sensors from contaminations; among these treatments an optimal one was chosen enabling stabilization of the charge state of the sensor surface. The value of the surface charge in sensors immersed in buffer solutions with different pH values was measured.
Keywords :
charge measurement; nanosensors; nanowires; silicon-on-insulator; surface treatment; transistors; SOI nanowire sensor; SOI nanowire transistor; Si; charge state; drain-gate characteristic measurement; pH value; silicon-on-insulator structure; surface charge density; surface treatment; Atmospheric measurements; Digital video broadcasting; Logic gates; Particle measurements; Pollution measurement; Surface treatment; Three dimensional displays; SOI nanowire sensors; pH value; surface treatment;
Conference_Titel :
Micro/Nanotechnologies and Electron Devices (EDM), 2010 International Conference and Seminar on
Conference_Location :
Novosibirsk
Print_ISBN :
978-1-4244-6626-9
DOI :
10.1109/EDM.2010.5568652