Title :
Clustering based evaluation of IDDQ measurements: applications in testing and classification of ICs
Author :
Jandhyala, Sri ; Balachandran, Hari ; Sengupta, Manidip ; Jayasumana, Anura P.
Author_Institution :
Texas Instrum. Inc., Dallas, TX, USA
Abstract :
Effectiveness of the clustering based approach in detecting devices with abnormal IDDQ values is evaluated using data from the SEMATECH test methods experiment. The results from clustering are compared to the results obtained on actual silicon during the SEMATECH study. The differences between the results obtained in each case are analyzed. The clustering approach is also compared to two common IDDQ test techniques, the single-threshold approach and the delta-IDDQ approach, and the results are presented
Keywords :
CMOS integrated circuits; failure analysis; integrated circuit measurement; integrated circuit testing; statistical analysis; CMOS; IDDQ measurements; IC classification; IC testing; SEMATECH test methods experiment; clustering based evaluation; Application software; Failure analysis; Gas detectors; Instruments; Integrated circuit testing; Manufacturing; Packaging; Process design; Production; Read only memory;
Conference_Titel :
VLSI Test Symposium, 2000. Proceedings. 18th IEEE
Conference_Location :
Montreal, Que.
Print_ISBN :
0-7695-0613-5
DOI :
10.1109/VTEST.2000.843877
