DocumentCode :
2015137
Title :
Statistical dependence of pixel intensities for pattern recognition
Author :
Smielik, Ievgen ; Kuhnert, Klaus-Dieter
Author_Institution :
Inst. for Real-Time Learning Syst., Univ. of Siegen, Siegen, Germany
fYear :
2013
fDate :
25-28 Feb. 2013
Firstpage :
1179
Lastpage :
1183
Abstract :
In this paper, we describe an algorithm for speeding up object recognition by reducing the amount of pixels taken into account when processing images. We show that some statistically stable regions can be found on an image. Taking just one pixel from each region preserves the most of information of the image. We employ linear dependency between pixel intensity values to organize neighbouring pixels in groups. Bayesian classification was chosen to prove suitability. We present the results that show computation speed increase without significant performance losses.
Keywords :
Bayes methods; image classification; object recognition; statistical analysis; Bayesian classification; image information preservation; image processing; linear dependency; object recognition; pattern recognition; pixel intensity values; statistical dependence; Bayes methods; Computational modeling; Correlation; Encryption; Face; Probability density function; Probability distribution;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Technology (ICIT), 2013 IEEE International Conference on
Conference_Location :
Cape Town
Print_ISBN :
978-1-4673-4567-5
Electronic_ISBN :
978-1-4673-4568-2
Type :
conf
DOI :
10.1109/ICIT.2013.6505840
Filename :
6505840
Link To Document :
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