• DocumentCode
    2015156
  • Title

    Investigation of the Effect of Sb Doping on the Thermoelectric Properties of the Ge-based clathrates, Ba8Ga16+xSbxGe30-2x

  • Author

    Tran, V.H. ; Muller, Wayne ; Cai, K.F. ; Wang, H.F. ; He, X.R.

  • Author_Institution
    Inst. of Low Temp. & Struct. Res., Polish Acad. of Sci., Wroclaw
  • fYear
    2006
  • fDate
    6-10 Aug. 2006
  • Firstpage
    681
  • Lastpage
    683
  • Abstract
    We investigate the effect of Sb doping in the Ga-flux single crystalline samples Ba8Ga 16+xSbxGe30-2x (x = 0.5 - 4) by measurements of electrical resistivity (rho) and thermoelectric power (TEP) in the temperature range of 4-300 K. Our results show that doping even very small amount of Sb (x = 0.5) has drastic effects on the electronic structure of the parent Ba8Ga16Ge30 compound. The Sb-doping not only stabilizes the p-type transport properties but also improves the thermoelectric properties. TEP of Ba8Ga16.5Sb0.5Ge29 reaches a value of 212 muV/K at room temperature. However, the TEP of other alloys Ba8Ga 16+xSbxGe30-2x with x up to 4 does not change much upon addition of more Sb content (217 muV/K for x = 4). An analysis of the temperature dependence of rho and TEP of the studied materials implies the presence of a variable-range hopping mechanism
  • Keywords
    antimony compounds; barium compounds; doping; electrical resistivity; electronic structure; germanium compounds; organic compounds; thermoelectricity; 4 to 300 K; Ba8Ga 16+xSbxGe30-2x; Ba8Ga16.5Sb0.5Ge29; Ge; Sb; clathrates; doping effect; electrical resistivity; electronic structure; p-type transport property; thermoelectric power; thermoelectric property; Crystallization; Doping; Electric resistance; Electric variables measurement; Gallium alloys; Germanium alloys; Power measurement; Temperature distribution; Thermoelectricity; Tin alloys;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Thermoelectrics, 2006. ICT '06. 25th International Conference on
  • Conference_Location
    Vienna
  • ISSN
    1094-2734
  • Print_ISBN
    1-4244-0811-3
  • Electronic_ISBN
    1094-2734
  • Type

    conf

  • DOI
    10.1109/ICT.2006.331233
  • Filename
    4133385