DocumentCode :
2015164
Title :
Engineering Experience With the SEAC
Author :
Slutz, Ralph J.
fYear :
1951
fDate :
10-12 Dec. 1951
Firstpage :
90
Lastpage :
90
Keywords :
Circuit testing; Computer errors; Delay lines; Diodes; Electric breakdown; Electron tubes; Laboratories; Magnetic devices; Read only memory; Test equipment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Managing Requirements Knowledge (AFIPS), 1951 International Workshop on
Conference_Location :
Philadelphia, PA, USA
Type :
conf
DOI :
10.1109/AFIPS.1951.5
Filename :
5442641
Link To Document :
https://search.ricest.ac.ir/dl/search/defaultta.aspx?DTC=49&DC=2015164
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