DocumentCode
2015164
Title
Engineering Experience With the SEAC
Author
Slutz, Ralph J.
fYear
1951
fDate
10-12 Dec. 1951
Firstpage
90
Lastpage
90
Keywords
Circuit testing; Computer errors; Delay lines; Diodes; Electric breakdown; Electron tubes; Laboratories; Magnetic devices; Read only memory; Test equipment;
fLanguage
English
Publisher
ieee
Conference_Titel
Managing Requirements Knowledge (AFIPS), 1951 International Workshop on
Conference_Location
Philadelphia, PA, USA
Type
conf
DOI
10.1109/AFIPS.1951.5
Filename
5442641
Link To Document