DocumentCode
2015181
Title
Application Overview of the Potential Seebeck Microscope
Author
Ziolkowski, P. ; Karpinski, G. ; Platzek, D. ; Stiewe, C. ; Müller, E.
Author_Institution
German Aerosp. Center, Inst. of Mater. Res., Cologne
fYear
2006
fDate
6-10 Aug. 2006
Firstpage
684
Lastpage
688
Abstract
The scanning Potential Seebeck Microscope (PSM) turned out to be a suitable tool to investigate material properties not only for thermoelectrics. Numerous cooperation and projects which were successfully accomplished by DLR and Panco and their national and international partners have shown the wide spectrum of application for this measurement instrument. The continuing extension of applications and further developments on this instrument were documented within several publications [Platzek, et al., 2005, Platzek, et al., 2005, Chen, et al., 2005, Ziolkowski, et al., 2006, Platzek, et al., 2003] showing the scientific output achieved by applying the PSM. With regard to the further developments which have been made and the results obtained so far, this work will give an overview of the possible applications of the PSM. This multiplexed informations will mark the present status of development and will give an outlook for further goals to reach
Keywords
Seebeck effect; electrical conductivity measurement; scanning probe microscopy; thermoelectric devices; material homogeneity; measurement instrument; phase purity; scanning potential Seebeck microscope; spatially resolved measurement; thermal conductivity; thermoelectric property; Aerospace materials; Conducting materials; Electric variables measurement; Instruments; Microscopy; Probes; Temperature measurement; Thermal conductivity; Thermoelectricity; Voltage;
fLanguage
English
Publisher
ieee
Conference_Titel
Thermoelectrics, 2006. ICT '06. 25th International Conference on
Conference_Location
Vienna
ISSN
1094-2734
Print_ISBN
1-4244-0811-3
Electronic_ISBN
1094-2734
Type
conf
DOI
10.1109/ICT.2006.331234
Filename
4133386
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