• DocumentCode
    2015185
  • Title

    UV Nanoimprint Lithography Using an Elementwise Embossed Stamp

  • Author

    Jeong, Jun-Ho ; Sim, Young-Suk ; Sohn, Hyonkee ; Lee, Eung-Sug

  • Author_Institution
    Korea Institute of Machinery & Materials
  • fYear
    2004
  • fDate
    25-27 Aug. 2004
  • Firstpage
    233
  • Lastpage
    236
  • Abstract
    Ultraviolet-nanoimprint lithography (UV-NIL) is a promising method for cost-effectively defining nanoscale structures at room temperature and low pressure. In an attempt to apply a large area stamp to UV-NIL in a low vacuum environment, we have proposed a new UV-NIL process using an element-wise embossed stamp (EES), which consists of a number of elements, each of which is separated by channels. Nano-scale patterns of each element were fabricated using e-beam lithography and an etching process in which a Cr film was employed as a hard mask for transferring nanostructures to a quartz plate. Before pressing the EES, low viscosity resin droplets with a nano-liter volume were dispensed on each element of the EES. Experiments on UV-NIL were performed on an EVG620-NIL. 380 nm - 1 µm features of the EES were successfully transferred to 4 in. wafers. We measured patterns and residual layers on the imprinted wafers to evaluate the potential of the proposed process. Experiments showed that the EES enables UV-NIL using a large-area stamp in a low vacuum environment.
  • Keywords
    Etching; Lithography; Machinery; Nanolithography; Nanostructures; Pressing; Resins; Substrates; Temperature; Ultraviolet sources;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    MEMS, NANO and Smart Systems, 2004. ICMENS 2004. Proceedings. 2004 International Conference on
  • Print_ISBN
    0-7695-2189-4
  • Type

    conf

  • DOI
    10.1109/ICMENS.2004.1508952
  • Filename
    1508952