DocumentCode :
2015243
Title :
A novel method to assess the effect of diversity on Common Cause Failure mitigation
Author :
Kai Wang ; Aidong Xu ; Hong Wang ; Jie Liu ; Yan Song
Author_Institution :
Key Lab. of Ind. Inf., Shenyang Inst. of Autom., Shenyang, China
fYear :
2013
fDate :
25-28 Feb. 2013
Firstpage :
1204
Lastpage :
1209
Abstract :
Redundancy techniques are widely used to design fault tolerant systems. Diversity has long been used to protect redundant systems from Common Cause Failure (CCF). Whilst there is clear evidence that diversity can bring benefits, these benefits can be difficult to quantify. Therefore, a novel method which researches the effect of diversity on CCF mitigation from the component degradation state point of view is proposed in this paper. Four categories of impact factors (IFs), which influence the failure behavior of the component, are defined and the corresponding method of mapping diversity into component degradation valve (CDV) has been proposed aiming at the characteristics of each IF category. Then CCF analysis is performed based on weighted impact vectors which can be calculated from CDVs. Due to related reliability data has been collected for each IF category the method has a good applying prospect. An illustrative case study is presented, which shows the application process of the novel method.
Keywords :
failure analysis; fault tolerance; redundancy; reliability theory; valves; vectors; CCF analysis; CCF mitigation; CDV; IF category; common cause failure mitigation; component degradation state; component degradation valve; diversity effect assessment method; failure behavior; fault tolerant system; impact factors; mapping diversity; redundancy technique; redundant systems; reliability data; weighted impact vectors; Degradation; Production facilities; Reliability; Safety; Stress; Valves; Vectors; Common cause failure; component degradation state; diversity; impact factor category; weighted impact vector;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Industrial Technology (ICIT), 2013 IEEE International Conference on
Conference_Location :
Cape Town
Print_ISBN :
978-1-4673-4567-5
Electronic_ISBN :
978-1-4673-4568-2
Type :
conf
DOI :
10.1109/ICIT.2013.6505845
Filename :
6505845
Link To Document :
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