• DocumentCode
    2015614
  • Title

    Nontactile reliability testing of a micro optical attenuator

  • Author

    Rembe, Christian ; Aschemann, Harald ; Wiesche, Stefan Aus der ; Hofer, Eberhard P. ; Debeda, Helen ; Mohr, Juergen ; Wallrabe, Ulrike

  • Author_Institution
    Dept. of Meas., Control & Microtechnol., Ulm Univ., Germany
  • fYear
    2000
  • fDate
    2000
  • Firstpage
    123
  • Lastpage
    128
  • Abstract
    The reliability investigations presented in this paper have been performed on a micro opto electro mechanical switch developed for switching and attenuation of light propagation in optical fibers. It is demonstrated that high-speed cine photomicrography together with model based evaluation of the image sequences is a powerful diagnostic tool for reliability testing of dynamic processes in micro electro mechanical systems (MEMS)
  • Keywords
    micro-optics; microactuators; optical fibres; semiconductor device reliability; MEMS; dynamic processes; high-speed cine photomicrography; light propagation; micro optical attenuator; micro opto electro mechanical switch; nontactile reliability testing; optical fibers; Image sequences; Mechanical systems; Optical attenuators; Optical fibers; Optical propagation; Optical switches; Photomicrography; Power system modeling; Power system reliability; System testing;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Reliability Physics Symposium, 2000. Proceedings. 38th Annual 2000 IEEE International
  • Conference_Location
    San Jose, CA
  • Print_ISBN
    0-7803-5860-0
  • Type

    conf

  • DOI
    10.1109/RELPHY.2000.843902
  • Filename
    843902