DocumentCode :
2015699
Title :
Effect of W coating on microengine performance
Author :
Mani, S.S. ; Fleming, J.G. ; Walraven, J.A. ; Sniegowski, J.J. ; se Beer, M.P. ; Irwin, L.W. ; Tanner, D.M. ; LaVan, D.A. ; Dugger, M.T. ; Jakubczak, J. ; Miller, W.M.
Author_Institution :
Sandia Nat. Labs., Albuquerque, NM, USA
fYear :
2000
fDate :
2000
Firstpage :
146
Lastpage :
151
Abstract :
Two major problems associated with Si-based MEMS (MicroElectroMechanical Systems) devices are stiction and wear. Surface modifications are needed to reduce both adhesion and friction in micromechanical structures to solve these problems. In this paper, we will present a CVD (Chemical Vapor Deposition) process that selectively coats MEMS devices with tungsten and significantly enhances device durability. Tungsten CVD is used in the integrated-circuit industry, which makes this approach manufacturable. This selective deposition process results in a very conformal coating and can potentially address both stiction and wear problems confronting MEMS processing. The selective deposition of tungsten is accomplished through the silicon reduction of WF6. The self-limiting nature of the process ensures consistent process control. The tungsten is deposited after the removal of the sacrificial oxides to minimize stress and process integration problems. The tungsten coating adheres well and is hard and conducting, which enhances performance for numerous devices. Furthermore, since the deposited tungsten infiltrates under adhered silicon parts and the volume of W deposited is less than the amount of Si consumed, it appears to be possible to release adhered parts that are contacted over small areas such as dimples. The wear resistance of tungsten coated parts has been shown to be significantly improved by microengine test structures
Keywords :
adhesion; chemical vapour deposition; elemental semiconductors; friction; metallic thin films; micromotors; silicon; stiction; surface treatment; tungsten; wear resistant coatings; CVD; Si; Si-based MEMS; W; W coating; WF6; adhered parts; adhesion; chemical vapor deposition; conformal coating; device durability; dimples; friction; microelectromechanical systems; microengine performance; microengine test structures; process control; sacrificial oxides; selective deposition process; silicon reduction; stiction; surface modifications; tungsten; wear; wear resistance; Adhesives; Chemical vapor deposition; Coatings; Friction; Manufacturing industries; Microelectromechanical devices; Microelectromechanical systems; Micromechanical devices; Silicon; Tungsten;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Reliability Physics Symposium, 2000. Proceedings. 38th Annual 2000 IEEE International
Conference_Location :
San Jose, CA
Print_ISBN :
0-7803-5860-0
Type :
conf
DOI :
10.1109/RELPHY.2000.843905
Filename :
843905
Link To Document :
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