DocumentCode :
2015887
Title :
By-Pass Transition in Microchannels under EDL Effect
Author :
Tardu, Sedat
Author_Institution :
Laboratoire des Ecoulements Géophysiques et Industriels
fYear :
2004
fDate :
25-27 Aug. 2004
Firstpage :
393
Lastpage :
400
Abstract :
The effect of the electric double layer (EDL) on the bypass transition mechanism in the linear evolution stage is explored through direct numerical simulations. An initial perturbation velocity field consisting of a pair of counter-rotating vortices is introduced in Poiseuille and EDL flows and the time-space evolution of the perturbed field is analysed for short times at half the critical Reynolds numbers (3000 for Poiseuille and 300 for EDL). The wall normal and spanwise perturbation velocities development are both quantitatively and qualitatively similar in macro and micro flows. The streamwise velocity, which is initially zero and set up by the generation of the wall normal vorticity is twice larger under the EDL effect. Both flows develop inclined strong streamwise shear layers. Overall is the close similarity of the disturbance evolution showing that the three dimensional linear mechanism in EDL flow lead to the structures that are at least as strong as in Poiseuille flow.
Keywords :
Conductivity; Electrons; Equations; Fluid dynamics; Friction; Hydrodynamics; Liquids; Microchannel; Stability; Viscosity;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MEMS, NANO and Smart Systems, 2004. ICMENS 2004. Proceedings. 2004 International Conference on
Print_ISBN :
0-7695-2189-4
Type :
conf
DOI :
10.1109/ICMENS.2004.1508982
Filename :
1508982
Link To Document :
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