Title :
A computationally practical approach to simulating complex surface-micromachined structures with fabrication non-idealities
Author :
Yie, H. ; Bart, S.F. ; White, J. ; Senturia, S.D.
fDate :
29 Jan-2 Feb 1995
Keywords :
Acceleration; Accelerometers; Capacitors; Computational modeling; Electromechanical sensors; Electrostatic analysis; Fabrication; Fingers; Residual stresses; Voltage;
Conference_Titel :
Micro Electro Mechanical Systems, 1995, MEMS '95, Proceedings. IEEE
Print_ISBN :
0-7803-2503-6
DOI :
10.1109/MEMSYS.1995.472541