• DocumentCode
    2016458
  • Title

    A 65nm CMOS low-noise three band group WiMedia UWB receiver

  • Author

    Ko, Won ; Shin, Heeseon ; Ko, Sangsoo ; Yim, Jounghyun ; Kang, Byoungjoong ; Kim, Taewan ; Ryu, Inhyo ; Yang, Sung-Gi ; Bae, Jong-Dae ; Park, Hojin

  • Author_Institution
    SAMSUNG Electron. Co., Ltd., Yongin, South Korea
  • fYear
    2011
  • fDate
    5-7 June 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    A low-noise and high-gain ultra wideband (UWB) receiver was developed using a 65 nm CMOS technology and a wafer-level fabricated package. In order to enhance the gain and noise figure over a wide frequency band, the resistive feedback amplifier and two cascode stages with the inductive load resonating at three different frequencies are employed. The fabricated UWB receiver showed a high gain of 72.6 dB ± 0.7 dB overall operating frequency range, and an average noise figure of 4.1 dB in 3168 to 4752 MHz, 4.3 dB in 6366 to 7920 MHz and 5.1 dB in 7392 to 8976 MHz frequency band, respectively. The noise figure at high frequency edge is lower than 6 dB. The measured sensitivities in three band groups meet all WiMedia PHY specifications.
  • Keywords
    CMOS integrated circuits; microwave receivers; ultra wideband communication; wafer level packaging; CMOS technology; WiMedia PHY specifications; WiMedia UWB receiver; low-noise receiver; resistive feedback amplifier; size 65 nm; three band groups; ultra wideband receiver; wafer-level fabricated package; CMOS integrated circuits; Gain; Noise figure; Receivers; Resonant frequency; Sensitivity; Transistors; CMOS receiver; noise figure; resistive feedback; ultra wideband;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits Symposium (RFIC), 2011 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1529-2517
  • Print_ISBN
    978-1-4244-8293-1
  • Electronic_ISBN
    1529-2517
  • Type

    conf

  • DOI
    10.1109/RFIC.2011.5940609
  • Filename
    5940609