Title :
A 65nm CMOS low-noise three band group WiMedia UWB receiver
Author :
Ko, Won ; Shin, Heeseon ; Ko, Sangsoo ; Yim, Jounghyun ; Kang, Byoungjoong ; Kim, Taewan ; Ryu, Inhyo ; Yang, Sung-Gi ; Bae, Jong-Dae ; Park, Hojin
Author_Institution :
SAMSUNG Electron. Co., Ltd., Yongin, South Korea
Abstract :
A low-noise and high-gain ultra wideband (UWB) receiver was developed using a 65 nm CMOS technology and a wafer-level fabricated package. In order to enhance the gain and noise figure over a wide frequency band, the resistive feedback amplifier and two cascode stages with the inductive load resonating at three different frequencies are employed. The fabricated UWB receiver showed a high gain of 72.6 dB ± 0.7 dB overall operating frequency range, and an average noise figure of 4.1 dB in 3168 to 4752 MHz, 4.3 dB in 6366 to 7920 MHz and 5.1 dB in 7392 to 8976 MHz frequency band, respectively. The noise figure at high frequency edge is lower than 6 dB. The measured sensitivities in three band groups meet all WiMedia PHY specifications.
Keywords :
CMOS integrated circuits; microwave receivers; ultra wideband communication; wafer level packaging; CMOS technology; WiMedia PHY specifications; WiMedia UWB receiver; low-noise receiver; resistive feedback amplifier; size 65 nm; three band groups; ultra wideband receiver; wafer-level fabricated package; CMOS integrated circuits; Gain; Noise figure; Receivers; Resonant frequency; Sensitivity; Transistors; CMOS receiver; noise figure; resistive feedback; ultra wideband;
Conference_Titel :
Radio Frequency Integrated Circuits Symposium (RFIC), 2011 IEEE
Conference_Location :
Baltimore, MD
Print_ISBN :
978-1-4244-8293-1
Electronic_ISBN :
1529-2517
DOI :
10.1109/RFIC.2011.5940609