Title :
Application of moment and Fourier descriptors to the accurate estimation of elliptical shape parameters
Author :
Safaee-Rad, R. ; Smith, K.C. ; Benhabib, B. ; Tchoukanov, I.
Author_Institution :
Toronto Univ., Ont., Canada
Abstract :
The problem of accurate parameter estimation of elliptical shapes is addressed. Three methods based on elliptical Fourier descriptors, area moments, and perimeter moments of 2-D elliptical shapes are presented. The mathematics of these methods is discussed and, for area moments, a set of new formulas based on Gauss´s theorem is given. To implement a comparative performance study, a method developed by R. Safaee-Rad et al. (1990), the weighted minimum-square-error (MSE) function, is included, and an objective and independent measure of goodness of fit is used. The performance of these methods is compared for two different cases, that of a perfect simulated ellipse and an imperfect imaged ellipse
Keywords :
Fourier analysis; parameter estimation; pattern recognition; Fourier descriptors; Gauss theorem; area moments; elliptical Fourier descriptors; elliptical shape parameters; parameter estimation; perimeter moments; weighted minimum-square-error function; Application software; Computer integrated manufacturing; Dentistry; Educational institutions; Image analysis; Laboratories; Mathematics; Mechanical engineering; Parameter estimation; Shape;
Conference_Titel :
Acoustics, Speech, and Signal Processing, 1991. ICASSP-91., 1991 International Conference on
Conference_Location :
Toronto, Ont.
Print_ISBN :
0-7803-0003-3
DOI :
10.1109/ICASSP.1991.150900