• DocumentCode
    2016528
  • Title

    Efficiency enhancement of 1,1,2,3,4,5-hexaphenylsilole-based organic light-emitting dioades by post-packaging annealing

  • Author

    Sun, J.X. ; Zhu, X.L. ; Dong, Y.Q. ; Tang, B.Z. ; Kwok, H.S.

  • Author_Institution
    Center for Display Res. & EEE Dept., Hong Kong Univ. of Sci. & Technol., Kowloon
  • fYear
    2005
  • fDate
    24-25 Dec. 2005
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    Organic light-emitting diodes based on the emission of 1,1,2,3,4,5-hexaphenylsilole (HPS) peaking at ~492nm have been fabricated and experienced post-packaging annealing in oven at 70degC for 5 hours. The electroluminescent (EL) characteristics were measured and compared in between the devices with and without annealing. The turn-on voltage (defined as the voltage to require 1 cd/m2), luminous efficiency and power efficiency of devices were much improved after this thermal treatment. Crystallization of the HPS film due to annealing and therefore the photoluminescence (PL) quantum yield (OslashPL) enhancement and electron mobility increase there of were proposed as the main factors accounting for the EL performance improvement
  • Keywords
    annealing; crystallisation; electroluminescence; electron mobility; organic light emitting diodes; photoluminescence; thin films; 1,1,2,3,4,5-hexaphenylsilole-based organic light-emitting diodes; 5 hrs; 70 C; HPS film; crystallization; electroluminescent characteristics; electron mobility; luminous efficiency; photoluminescence quantum yield enhancement; post-packaging annealing; power efficiency; thermal treatment; Annealing; Crystallization; Electron mobility; Flat panel displays; Fluorescence; Indium tin oxide; Organic light emitting diodes; Organic materials; Ovens; Voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    9th International Multitopic Conference, IEEE INMIC 2005
  • Conference_Location
    Karachi
  • Print_ISBN
    0-7803-9429-1
  • Electronic_ISBN
    0-7803-9430-5
  • Type

    conf

  • DOI
    10.1109/INMIC.2005.334418
  • Filename
    4133433