Title :
A millimeter-wave resistance error tolerant termination in multi-layered LTCC substrate
Author :
Yuasa, Takeshi ; Tahara, Yukihiro ; Yoneda, Naofumi ; Oh-Hashi, Hideyuki
Author_Institution :
Mitsubishi Electr. Corp., Kamakura, Japan
fDate :
Sept. 29 2009-Oct. 1 2009
Abstract :
A millimeter wave termination which is tolerant to the resistance error of the resistive film in a multi-layered LTCC substrate has been developed. The tolerance to the resistance error can be realized by a strip line bifurcation located outside the resistive film. It has been experimentally demonstrated that the reflection characteristic degradation by the resistance error of the proposed termination is reduced compared with the conventional one.
Keywords :
bifurcation; ceramic packaging; strip lines; millimeter wave termination; millimeter-wave resistance error tolerant termination; multi-layered LTCC substrate; resistive film; strip line bifurcation; Bifurcation; Circuits; Conductive films; Conductors; Degradation; Dielectric substrates; Electric resistance; Frequency; Optical films; Strips;
Conference_Titel :
Microwave Conference, 2009. EuMC 2009. European
Conference_Location :
Rome
Print_ISBN :
978-1-4244-4748-0
