• DocumentCode
    2016612
  • Title

    Lifetime evaluation on mid-infrared solid state laser

  • Author

    Lu Guo-guang ; Hao Ming-ming

  • Author_Institution
    Sci. & Technol. on Reliability Phys. & Applic. of Electron. Component Lab., Fifth Res. Inst., Guangzhou, China
  • fYear
    2015
  • fDate
    11-14 Aug. 2015
  • Firstpage
    19
  • Lastpage
    21
  • Abstract
    In this paper, 3-5μm solid state laser aging equipment was set up, according to the actual aging test result, we confirmed that the 3-5μm laser module (optical parametric oscillator) was the weakness part for the lifetime of the solid-state laser. Three groups of aging tests which the pumping power for the optical parametric oscillator was the accelerated stress were conducted on 3-5μm solid state lasers, according to the aging data analysis result, we can not only obtain the exponential degradation model of the optical parametric oscillator, but also we can obtain the accelerated model, and using these models we can quantitive evaluate the lifetime of the mid-infrared solid-state laser.
  • Keywords
    ageing; life testing; solid lasers; accelerated stress; aging equipment; aging test; exponential degradation model; laser module; lifetime evaluation; mid-infrared solid state laser; optical parametric oscillator; pumping power; wavelength 3 mum to 5 mum; Solids; aging test; degradation; lifetime; reliability;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
  • Conference_Location
    Changsha
  • Type

    conf

  • DOI
    10.1109/ICEPT.2015.7236535
  • Filename
    7236535