DocumentCode :
2016731
Title :
Effect of plasma source ion implantation on the mechanical properties of the trivalent chrome layer
Author :
Jong-Kuk Kim ; Eungsun Byon ; Hak-Joon Lee ; Sik-Chol Kwon
Author_Institution :
Korea Inst. of Machinery & Mater., Changwon, South Korea
fYear :
2003
fDate :
5-5 June 2003
Firstpage :
287
Abstract :
Summary form only given, as follows. Summary form only given. Hard chromium electroplating had contributed much to industry over 50 years before the environmental problem of hexavalent chrome has arisen. Many researches related with hexavalent chromium replacement have been conducted according to extension of awareness about such an environmental problem. Among these studies, an investigation has been undertaken by nitrogen plasma ion implantation and pulsed plasma process to develop the novel process as an alternative to hexavalent chromium electroplating. In this study, Cr plating from trivalency chrome bath was conducted, followed by the plasma ion implantation (PIII) treatment to improve mechanical properties of the trivalency chrome plated films. Nitrogen ion implantation was conducted onto a Cr plating layer under the conditions of several implantation doses and implantation energies. The films were characterized by optical microscopy, RBS and nanoindentator. From the results, color of film surface after ion implantation was changed to gray, and number of cracks in the trivalency chrome plated layer increased. XRD analysis of the films indicated the formation of hard compound layer of chromium-nitride. The surface hardness was improved from 13 to 17 GPa and projected range (implantation depth) of nitrogen ions in the film was 30 nm. The detailed results will be presented.
Keywords :
Rutherford backscattering; X-ray diffraction; chromium; electroplating; hardness; indentation; ion implantation; nitrogen; optical microscopy; surface hardening; 30 nm; Cr:N; N ion implantation; RBS; cracks; electroplating; implantation doses; implantation energies; mechanical properties; nanoindentation; optical microscopy; plasma source ion implantation; surface hardness; trivalent chrome layer; Chromium; Environmental factors; Ion implantation; Mechanical factors; Nitrogen; Optical films; Plasma applications; Plasma immersion ion implantation; Plasma properties; Plasma sources;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Plasma Science, 2003. ICOPS 2003. IEEE Conference Record - Abstracts. The 30th International Conference on
Conference_Location :
Jeju, South Korea
ISSN :
0730-9244
Print_ISBN :
0-7803-7911-X
Type :
conf
DOI :
10.1109/PLASMA.2003.1228842
Filename :
1228842
Link To Document :
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