• DocumentCode
    2016765
  • Title

    Wideband high efficiency envelope tracking integrated circuit for micro-base station power amplifiers

  • Author

    Kwak, Myoungbo ; Kimball, Donald ; Presti, Calogero ; Scuderi, Antonino ; Santagati, Carmelo ; Yan, Jonmei ; Asbeck, Peter ; Larson, Lawrence

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Univ. of California at San Diego, La Jolla, CA, USA
  • fYear
    2011
  • fDate
    5-7 June 2011
  • Firstpage
    1
  • Lastpage
    4
  • Abstract
    This paper presents a high performance BCD (Bipolar-CMOS-DMOS) monolithic envelope tracking IC to achieve high efficiency and linearity for micro-base station power amplifier applications. Measurement of the BCD high voltage (Vdd = 15 V) envelope amplifier shows an efficiency of 72% using WCDMA input signals (7.7 dB PAR). An envelope tracking power amplifier including a GaN FET RF stage has overall drain efficiency (DE) above 51%, with a normalized power RMS error below 1.2% and ACLR1 of -49 dBc using memory mitigation digital pre-distortion (DPD), at an average WCDMA output power above 2 W and a gain of 10 dB.
  • Keywords
    CMOS integrated circuits; III-V semiconductors; bipolar integrated circuits; field effect transistors; gallium compounds; power amplifiers; radiofrequency amplifiers; radiofrequency integrated circuits; wide band gap semiconductors; wideband amplifiers; BCD monolithic envelope tracking IC; FET RF stage; GaN; WCDMA; bipolar-CMOS-DMOS IC; drain efficiency; envelope tracking power amplifier; gain 10 dB; memory mitigation digital predistortion; microbase station power amplifiers; normalized power RMS error; voltage 15 V; wideband high-efficiency envelope tracking integrated circuit; Base stations; Multiaccess communication; Power amplifiers; Power generation; Radio frequency; Spread spectrum communication; Transistors; Base-station power amplifier; digital predistortion; efficiency; envelope tracking; linearity; micro base-station;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Radio Frequency Integrated Circuits Symposium (RFIC), 2011 IEEE
  • Conference_Location
    Baltimore, MD
  • ISSN
    1529-2517
  • Print_ISBN
    978-1-4244-8293-1
  • Electronic_ISBN
    1529-2517
  • Type

    conf

  • DOI
    10.1109/RFIC.2011.5940621
  • Filename
    5940621