Title :
Reliability- and Process-Variation Aware Design of VLSI Circuits
Author :
Alam, M. ; Kang, Kary ; Paul, Bipul ; Roy, Kaushik
Author_Institution :
Purdue Univ., West Lafayette
Abstract :
We review the literature for reliability- and process-variation aware VLSI design to find that an exciting area of research/application is rapidly emerging as a core topic of IC design. Design of reliable circuits with unreliable component is a significant challenge that is likely to remain relevant for all circuit designs from now on, therefore any contribution in this field is likely to have lasting effect of the design philosophy of integrated circuits
Keywords :
VLSI; integrated circuit design; integrated circuit reliability; IC design; VLSI circuits; cicuit reliability; process variation aware design; Application specific integrated circuits; Circuit synthesis; Circuit testing; Delay; Design methodology; Design optimization; Integrated circuit reliability; Process design; Transistors; Very large scale integration;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2007. IPFA 2007. 14th International Symposium on the
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-1014-9
DOI :
10.1109/IPFA.2007.4378050
