DocumentCode :
2016864
Title :
Reliability analysis of defense plans against slow and fast cascading phenomena
Author :
Panteli, Mathaios ; Crossley, Peter A. ; Kirschen, Daniel S.
Author_Institution :
Sch. of Electr. & Electron. Eng., Univ. of Manchester, Manchester, UK
fYear :
2013
fDate :
16-20 June 2013
Firstpage :
1
Lastpage :
6
Abstract :
The development of a blackout can be typically divided in two stages: slow cascading and fast cascading events. The role of the human operator and of the fast automatic actions varies depending on the speed of the blackout process. This paper first provides a breakdown of a blackout in different stages based on the speed of the outage propagation. This helps identify the importance of the system operator and automatic actions in each blackout stage. Next, a reliability assessment framework is presented for assessing the impact of operators´ ineffective response during the early stages of an electrical disturbance. In addition, a method based on Markov modeling and fault tree analysis is proposed for evaluating the reliability of System Integrity Protection Schemes (SIPS), which are usually installed to provide protection against fast dynamic events.
Keywords :
Markov processes; fault trees; power system faults; power system reliability; Markov modeling; blackout process; blackout stage; cascading phenomena; defense plans; electrical disturbance; fast cascading event; fast dynamic events; fault tree analysis; human operator; outage propagation; reliability analysis; reliability assessment framework; slow cascading event; system integrity protection schemes; system operator; Markov processes; Monitoring; Power system faults; Power system protection; Power system reliability; Relays; Reliability; Cascading Outages; Power System Blackout; Power System Operation; Reliability Assessment;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
PowerTech (POWERTECH), 2013 IEEE Grenoble
Conference_Location :
Grenoble
Type :
conf
DOI :
10.1109/PTC.2013.6652145
Filename :
6652145
Link To Document :
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