Investigation and modeling of epoxies aging tests under the effect of variation of parameters on partial discharge (PD)

This paper is based on the investigations made by applying High Voltage (H. V.) ageing test on five different epoxy insulators under different voltage and temperature conditions. Also the effect of temperate is monitored for PD according to the IS: 11322-1985 manual and IOP publication 35 {IOP report publication 35(2002) 33-39} as a matter of investigation on material performance. Experiments are carried out on widely employed simple epoxy resin based high-voltage insulation electrode systems having a pin hole (cavity). Before placing epoxy insulator at high voltage assembly it is passed from x-ray unit to check the size of pin hole. Each insulator temperature is regulated from 30°C to 150°C inside thermal chamber during the experiment. On the basis of a previously performed analysis of the ageing mechanism in different solid insulating materials, simple phenomenological aging and life effects are proposed. This gives a new approach and new tool for the problem for future application on electrical components. The investigation and modeling of long term ageing test by studying the effect of parameters (i. e. temperature on PD and energy wasted in the epoxy during ageing) were assumed to be a stress function in the inverse power law.