Title :
Influence of parameter distribution on simultaneous switching noise (SSN) for CMOS output drivers
Author :
Vaidyanath, Arun ; Prince, J.L.
Author_Institution :
Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
Abstract :
Modeling of Simultaneous Switching Noise (SSN) has previously been done considering single-point parameters. This paper deals with the effects of parameter distributions on SSN. Parameters investigated include threshold voltage, drive strength, signal arrival times, power supply and temperature
Keywords :
CMOS integrated circuits; CMOS output drivers; drive strength; modeling; parameter distribution; power supply; signal arrival times; simultaneous switching noise; temperature; threshold voltage; Driver circuits; Drives; Electronics packaging; Power supplies; Predictive models; Semiconductor device modeling; Solid modeling; Switches; Temperature distribution; Threshold voltage;
Conference_Titel :
Electrical Performance of Electronic packaging, 1994., IEEE 3rd Topical Meeting on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-2411-0
DOI :
10.1109/EPEP.1994.594063
