• DocumentCode
    2017039
  • Title

    Influence of parameter distribution on simultaneous switching noise (SSN) for CMOS output drivers

  • Author

    Vaidyanath, Arun ; Prince, J.L.

  • Author_Institution
    Dept. of Electr. & Comput. Eng., Arizona Univ., Tucson, AZ, USA
  • fYear
    1994
  • fDate
    2-4 Nov 1994
  • Firstpage
    33
  • Lastpage
    38
  • Abstract
    Modeling of Simultaneous Switching Noise (SSN) has previously been done considering single-point parameters. This paper deals with the effects of parameter distributions on SSN. Parameters investigated include threshold voltage, drive strength, signal arrival times, power supply and temperature
  • Keywords
    CMOS integrated circuits; CMOS output drivers; drive strength; modeling; parameter distribution; power supply; signal arrival times; simultaneous switching noise; temperature; threshold voltage; Driver circuits; Drives; Electronics packaging; Power supplies; Predictive models; Semiconductor device modeling; Solid modeling; Switches; Temperature distribution; Threshold voltage;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electrical Performance of Electronic packaging, 1994., IEEE 3rd Topical Meeting on
  • Conference_Location
    Monterey, CA
  • Print_ISBN
    0-7803-2411-0
  • Type

    conf

  • DOI
    10.1109/EPEP.1994.594063
  • Filename
    594063