DocumentCode :
2017072
Title :
Block-Level Relaxation for Timing-Robust Asynchronous Circuits Based on Eager Evaluation
Author :
Jeong, Cheoljoo ; Nowick, Steven M.
Author_Institution :
Dept. of Comput. Sci., Columbia Univ., New York, NY
fYear :
2008
fDate :
7-10 April 2008
Firstpage :
95
Lastpage :
104
Abstract :
As variability and timing closure become critical challenges in synchronous CAD flows, one attractive alternative is to use robust asynchronous circuits which gracefully accommodate timing discrepancies. In this approach, each gate in an initial Boolean netlist is typically replaced by a robust dual-rail asynchronous template. However, these circuits typically have significant area and latency overhead. A gate-level relaxation approach has recently been proposed: replacing selected simple gates by asynchronous templates performing eager evaluation, without affecting the circuit´s overall timing robustness. In this paper, the approach has been significantly extended to block-level relaxation: handling arbitrarily complex multi-output blocks. For these circuits, a much wider range of optimizations is applicable than in the gate-level approach. A block-level relaxation algorithm is implemented, and experiments performed on several high-speed arithmetic circuits (Brent-Kung and Kogge-Stone adders, combinational multipliers). On average, 38.4% of the blocks could be relaxed (48.4% best-case),with area improvement of 27.2% (49.7% best-case)and delay improvement of 13.1% (25.5% best-case) for the critical path,while still preserving the circuit´s overall timing robustness.
Keywords :
Boolean functions; asynchronous circuits; circuit CAD; digital arithmetic; optimisation; relaxation; Boolean netlist; arbitrarily complex multioutput blocks; block-level relaxation algorithm; dual-rail asynchronous template; eager evaluation; gate-level relaxation approach; high-speed arithmetic circuits; synchronous CAD flows; timing discrepancy; timing-robust asynchronous circuits; Asynchronous circuits; Computer science; Delay; Design automation; Energy consumption; Robustness; Temperature; Thin film transistors; Timing; Wire; VLSI; asynchronous circuits; computer-aided design; logic optimization; low power; robustness;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Asynchronous Circuits and Systems, 2008. ASYNC '08. 14th IEEE International Symposium on
Conference_Location :
Newcastle upon Tyne
ISSN :
1522-8681
Print_ISBN :
978-0-7695-3107-6
Type :
conf
DOI :
10.1109/ASYNC.2008.25
Filename :
4557002
Link To Document :
بازگشت