Title :
Influence of Technological Parameters on the Behavior during Aging at High Temperature of Various Packages, in the Automotive Environment
Author :
Auguste, B.M. ; Pascal, L. ; Annabelle, G. ; Helene, F.
Author_Institution :
ATMEL Nantes SA, Nantes
Abstract :
The failure mechanism related to Kirkendall voids is a consequence of the intermetallic thickness growth (Au- Al). It impacts the wires bonding reliability at high temperature. Temperature accelerates the intermetallic thickness growth as the diffusion between gold and aluminium is accelerated. Moreover, the role of the package geometry was identified, and experimental results were confirmed by both simple analytical model and FEM simulations. This study confirms a good choice for the automotive environment at high thermal aging (150degC). Finally, the WP and BS tests of the thermal behavior do not allow a continuous monitoring of the degradation, and are time and sample consuming. So we are developing a measurement procedure coupled to a theoretical study of the resistance variation of the wire bond, aimed to produce an early failure indicator of the ball bonds.
Keywords :
ageing; automotive electronics; electronics packaging; failure analysis; high-temperature effects; Kirkendall voids; automotive environment; bonding reliability; failure mechanism; high thermal aging; intermetallic thickness growth; wire bond; Acceleration; Analytical models; Automotive engineering; Bonding; Failure analysis; Intermetallic; Packaging; Temperature; Wires;
Conference_Titel :
Physical and Failure Analysis of Integrated Circuits, 2007. IPFA 2007. 14th International Symposium on the
Conference_Location :
Bangalore
Print_ISBN :
978-1-4244-1014-9
DOI :
10.1109/IPFA.2007.4378062