DocumentCode :
2017228
Title :
Modeling of Surface Forces between Micron-Sized Objects in Dry Condition
Author :
Hariri, A. ; Zu, J.W. ; Mrad, R.B.
Author_Institution :
University of Toronto
fYear :
2004
fDate :
25-27 Aug. 2004
Firstpage :
623
Lastpage :
628
Abstract :
Capillary, van der Walls (vdW) and electrostatic forces, which usually termed as surface forces, can significantly affect the behavior and performance of Micro Electro Mechanical Systems (MEMS) containing surfaces that can contact each other. Here, we are concerned with vdW force, which is the dominant surface force between conducting surfaces in the dry condition. In this study, we first review existing roughness models described by stochastic processes of Gaussian and Fractal type. Then, the vdW force is formulated using two methods by considering the first and second order probability density function (pdf) of the height distribution of rough surfaces. The resulting formulae are functions of the correlation ( ñ) between successive sampling points. By analyzing these formulae based on the correlation and other parameters, the upper and lower bound of vdW force are identified and a numericalbased closed-form formula for the upper bound is derived. Finally, various situations are discussed based on the developed equations and data from a surface micro machining process.
Keywords :
Electrostatics; Fractals; Mechanical systems; Micromechanical devices; Probability density function; Rough surfaces; Sampling methods; Stochastic processes; Surface roughness; Upper bound;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
MEMS, NANO and Smart Systems, 2004. ICMENS 2004. Proceedings. 2004 International Conference on
Print_ISBN :
0-7695-2189-4
Type :
conf
DOI :
10.1109/ICMENS.2004.1509026
Filename :
1509026
Link To Document :
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