Title :
Simultaneous switching noise predictors for CMOS OCDs
Author :
Katopis, G. ; Lin, Phillip
Author_Institution :
IBM Corp., Poughkeepsie, NY, USA
Abstract :
In this paper closed form expressions are derived for the estimation of the switching noise generated by CMOS driver circuits with short channel. The results of ASX simulations that establish the accuracy of these predictors are also shown
Keywords :
CMOS integrated circuits; ASX simulations; CMOS OCDs; predictors; short channel driver circuits; simultaneous switching noise; Accuracy; Circuit noise; Circuit simulation; Driver circuits; Equations; Integrated circuit noise; Predictive models; Semiconductor device modeling; Switching circuits; Threshold voltage;
Conference_Titel :
Electrical Performance of Electronic packaging, 1994., IEEE 3rd Topical Meeting on
Conference_Location :
Monterey, CA
Print_ISBN :
0-7803-2411-0
DOI :
10.1109/EPEP.1994.594064
