DocumentCode
2017341
Title
Beyond scaling - teaching the old dog some new tricks [Semiconductor technology]
Author
Iyer, Srikanth S.
Author_Institution
Semiconductor Res. & Dev. Center, Hopewell
fYear
2007
fDate
11-13 July 2007
Abstract
While the semiconductor industry has been focused on the challenges of scaling, it has become quite apparent that one must take a broader view of delivering productivity and performance gains in this new regime of non- classical scaling. While transistor level and interconnect performance will continue to make strides through the innovative use of stress engineering, novel materials such as high k dielectrics in the front end and low k dielectrics and high conductivity interconnects in the backend, there is much more to be gained by addressing the issues of memory integration, on- chip decoupling and autonomic chip functions.
Keywords
integrated circuit manufacture; semiconductor device manufacture; semiconductor technology; autonomic chip functions; beyond scaling; interconnect performance; memory integration; nonclassical scaling; onchip decoupling; semiconductor industry; stress engineering; transistor level; Capacitive sensors; Compressive stress; Costs; Dielectric constant; Dielectric materials; High K dielectric materials; High-K gate dielectrics; Lithography; Productivity;
fLanguage
English
Publisher
ieee
Conference_Titel
Physical and Failure Analysis of Integrated Circuits, 2007. IPFA 2007. 14th International Symposium on the
Conference_Location
Bangalore
Print_ISBN
978-1-4244-1014-9
Type
conf
DOI
10.1109/IPFA.2007.4378071
Filename
4378071
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