• DocumentCode
    2017341
  • Title

    Beyond scaling - teaching the old dog some new tricks [Semiconductor technology]

  • Author

    Iyer, Srikanth S.

  • Author_Institution
    Semiconductor Res. & Dev. Center, Hopewell
  • fYear
    2007
  • fDate
    11-13 July 2007
  • Abstract
    While the semiconductor industry has been focused on the challenges of scaling, it has become quite apparent that one must take a broader view of delivering productivity and performance gains in this new regime of non- classical scaling. While transistor level and interconnect performance will continue to make strides through the innovative use of stress engineering, novel materials such as high k dielectrics in the front end and low k dielectrics and high conductivity interconnects in the backend, there is much more to be gained by addressing the issues of memory integration, on- chip decoupling and autonomic chip functions.
  • Keywords
    integrated circuit manufacture; semiconductor device manufacture; semiconductor technology; autonomic chip functions; beyond scaling; interconnect performance; memory integration; nonclassical scaling; onchip decoupling; semiconductor industry; stress engineering; transistor level; Capacitive sensors; Compressive stress; Costs; Dielectric constant; Dielectric materials; High K dielectric materials; High-K gate dielectrics; Lithography; Productivity;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Physical and Failure Analysis of Integrated Circuits, 2007. IPFA 2007. 14th International Symposium on the
  • Conference_Location
    Bangalore
  • Print_ISBN
    978-1-4244-1014-9
  • Type

    conf

  • DOI
    10.1109/IPFA.2007.4378071
  • Filename
    4378071