IC Debug and Defect Localization using Dynamic Laser Stimulation and Time-Resolved Emission

Author

Ferrigno, J. ; Perdu, P. ; Sanchez, K. ; Lewis, David ; Valletc, M. ; Dudit, Sylvain

Author_Institution

French Space Agency, Toulouse

fYear

2007

fDate

11-13 July 2007

Abstract

Dynamic optical techniques (light emission and laser stimulation techniques) are routinely used for precise IC defect localization. As device technology is more and more shrinking, developing new techniques for defect localization is becoming a crucial challenge. Dynamic Laser Stimulation (DLS) techniques based on near-infrared laser scanning are used for failure analysis, design debug and time margin studies or critical path analysis. Using Time Resolved Emission (TRE) technique, scan chain, timing and logic failure are shown to be quickly and precisely identified [1]. On 180nm and 120 nm test structures devices, we will present results showing the accuracy and the complementary of DLS and TRE in order to help Failure Analysists or Debug engineers to localize defect without performing physical analysis.

Keywords

failure analysis; integrated circuit reliability; laser beam applications; IC debug; critical path analysis; defect localization; dynamic laser stimulation; dynamic optical techniques; failure analysis; laser stimulation techniques; light emission; logic failure; near infrared laser scanning; scan chain; time resolved emission; Failure analysis; Frequency; Laboratories; Microelectronics; Optical design; Photonic integrated circuits; Stimulated emission; Testing; Timing; Vehicle dynamics;

fLanguage

English

Publisher

ieee

Conference_Titel

Physical and Failure Analysis of Integrated Circuits, 2007. IPFA 2007. 14th International Symposium on the

Conference_Location

Bangalore

Print_ISBN

978-1-4244-1014-9

Type

conf

DOI

10.1109/IPFA.2007.4378090

Filename

4378090