DocumentCode :
2018253
Title :
Grid-connected PV inverter reliability considerations: A review
Author :
Zhou, Quan ; Xun, Chunlin ; Dan, Qiang ; Liu, Sheng
Author_Institution :
China-EU Institute for Clean and Renewable Energy at Huazhong University of Science & Technology Wuhan, 430074, China
fYear :
2015
fDate :
11-14 Aug. 2015
Firstpage :
266
Lastpage :
274
Abstract :
With fast growing application of solar photovoltaic (PV) technology, its reliability is being studied extensively. Note that the photovoltaic inverter is considered as the weakest link of a PV system. This paper, therefore, gives a review on reliability of the grid-connected photovoltaic inverter. The discussion mainly focus on two typical kinds of vulnerable inverter components, i.e., DC-capacitors and insulated gate bipolar transistor switches. The intent of this review is to provide a clear picture of reliability research in photovoltaic inverters. Finally, attempts are made to highlight the direction for future research.
Keywords :
Capacitors; Insulated gate bipolar transistors; Lead; Logic gates; Reliability; Substrates; Switches; DC-capacitor; insulated gate bipolar transistor; photovoltaic inverter; reliability;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
Conference_Location :
Changsha, China
Type :
conf
DOI :
10.1109/ICEPT.2015.7236590
Filename :
7236590
Link To Document :
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