Title :
Automated measuring device for microwave frequency terminals on the basis of logarithmic amplifier
Author :
Shauerman, Alexander A. ; Zharikov, Mikhail S. ; Borisov, Alexander V. ; Shauerman, Ainur K.
Author_Institution :
Siberian State Univ. of Telecommun. & Inf., Novosibirsk, Russia
fDate :
June 30 2010-July 4 2010
Abstract :
This article describes application of logarithmic amplifier, which can be used to design the device for measuring the complex reflection coefficient (CRC) of the microwave range terminals. The methods for measuring the complex reflection coefficient by the sensor, parameters of which are specified during the calibration, are considered here. The sources of measurement uncertainty are analyzed. The methods for estimating errors of the developed device are presented.
Keywords :
measurement uncertainty; microwave amplifiers; sensors; CRC; automated measuring device; complex reflection coefficient; error estimation; logarithmic amplifier; measurement uncertainty; microwave frequency terminals; Generators; Seminars; Reflection coefficient; logarithmic amplifier; measurement; microwave frequency; sensor;
Conference_Titel :
Micro/Nanotechnologies and Electron Devices (EDM), 2010 International Conference and Seminar on
Conference_Location :
Novosibirsk
Print_ISBN :
978-1-4244-6626-9
DOI :
10.1109/EDM.2010.5568811
