DocumentCode :
2018695
Title :
W2W wafer level vacuum packaging of MEMS devices using solder
Author :
Zhang, Honglin ; An, Bing ; Niu, Chenxu
Author_Institution :
School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, China
fYear :
2015
fDate :
11-14 Aug. 2015
Firstpage :
354
Lastpage :
358
Abstract :
With the increasing integration of mechanical and electronic components on the MEMS cavity, the complexity of the system enhances exponentially and thus leads to a need for the larger size package and good process compatibility. Wafer-level vacuum packaging (WLVP) is a promising direction, in this work, Wafer-to-Wafer (W2W) vacuum bonding for MEMS devices by solder sealing were investigated. The wafers with a solder seal ring array on were prepared and W2W bonding was processed in a vacuum bonding system. Then the package units were diced and tested. The shear strength and hermetic test results showed that the vacuum into the samples met the requirements of MIL-STD-883. For further, the relation between the width of the solder ring and the pressure-bearing ability of the device was investigated so as to balance the reliability and size of the MEMS devices.
Keywords :
Bonding; Micromechanical devices; Packaging; Scanning electron microscopy; Seals; Testing; Vacuum technology; Solder sealing; Wafer level vacuum packaging; Wafer-to-wafer package;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
Conference_Location :
Changsha, China
Type :
conf
DOI :
10.1109/ICEPT.2015.7236607
Filename :
7236607
Link To Document :
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