• DocumentCode
    2018695
  • Title

    W2W wafer level vacuum packaging of MEMS devices using solder

  • Author

    Zhang, Honglin ; An, Bing ; Niu, Chenxu

  • Author_Institution
    School of Materials Science and Engineering, Huazhong University of Science and Technology, Wuhan, China
  • fYear
    2015
  • fDate
    11-14 Aug. 2015
  • Firstpage
    354
  • Lastpage
    358
  • Abstract
    With the increasing integration of mechanical and electronic components on the MEMS cavity, the complexity of the system enhances exponentially and thus leads to a need for the larger size package and good process compatibility. Wafer-level vacuum packaging (WLVP) is a promising direction, in this work, Wafer-to-Wafer (W2W) vacuum bonding for MEMS devices by solder sealing were investigated. The wafers with a solder seal ring array on were prepared and W2W bonding was processed in a vacuum bonding system. Then the package units were diced and tested. The shear strength and hermetic test results showed that the vacuum into the samples met the requirements of MIL-STD-883. For further, the relation between the width of the solder ring and the pressure-bearing ability of the device was investigated so as to balance the reliability and size of the MEMS devices.
  • Keywords
    Bonding; Micromechanical devices; Packaging; Scanning electron microscopy; Seals; Testing; Vacuum technology; Solder sealing; Wafer level vacuum packaging; Wafer-to-wafer package;
  • fLanguage
    English
  • Publisher
    ieee
  • Conference_Titel
    Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
  • Conference_Location
    Changsha, China
  • Type

    conf

  • DOI
    10.1109/ICEPT.2015.7236607
  • Filename
    7236607