DocumentCode :
2018893
Title :
Status and Trend of SiC Power Semiconductor Packaging
Author :
Wang, Yangang ; Dai, Xiaoping ; Liu, Guoyou ; Wu, Yibo ; Li, Daohui ; Jones, Steve
Author_Institution :
Power Semiconductor R&D Centre, Dynex Semiconductor Ltd., Zhuzhou CSR Times Electric Co. Ltd., Doddington Road, Lincoln LN6 3LF, United Kingdom
fYear :
2015
fDate :
11-14 Aug. 2015
Firstpage :
396
Lastpage :
402
Abstract :
With the superior electrical and thermal properties of wide band gap materials, Silicon Carbide (SiC) devices are capable of working at high power density, high temperature, high frequency, high voltage and high efficiency. Although the substantial investigation on SiC material, device and packaging technologies have been done, there are a series of problems needed to be solved, such as the material quality, cost and packaging for high power density and high temperature. In this work, the status and trend of SiC power device packaging are addressed. A brief review of hybrid and full SiC power module in terms of market prospect, module structure, material and technologies are discussed. Then, the performance and reliability of Si and SiC modules are compared, including the thermal resistance, power loss and power cycling capability etc. finally, the packaging trend of SiC module for high thermal performance, high temperature and high reliability are proposed.
Keywords :
Electronic packaging thermal management; Insulated gate bipolar transistors; Multichip modules; Reliability; Silicon; Silicon carbide; Packaging; Performance; Power module; Reliability; SiC;
fLanguage :
English
Publisher :
ieee
Conference_Titel :
Electronic Packaging Technology (ICEPT), 2015 16th International Conference on
Conference_Location :
Changsha, China
Type :
conf
DOI :
10.1109/ICEPT.2015.7236613
Filename :
7236613
Link To Document :
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